The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Apr. 05, 2014
Technology Assessment & Transfer, Inc., Annapolis, MD (US);
J. Scott Steckenrider, Hartford City, IN (US);
TECHNOLOGY ASSESSMENT & TRANSFER, INC., Annapolis, MD (US);
Abstract
A method of non-destructive detection of solid inclusions with varying sensitivities but highly congruent positional identification by both short-wavelength and long-wavelength methods. The short-wavelength method consists of lateral scatter (LS) and the long-wavelength method consists of THz imaging. The LS method was able to detect all agglomerated inclusions, transparency variations, voids, and localized phase differences. The THz imaging was able to routinely detect solid inclusions and index inhomogeneity. In combination, the LS and THz imaging methods were able to detect all relevant types of material variation, so that the combination of the two non-destructive testing methods provides a solution capable of detecting the full array of critical material variations in transparent polycrystalline ceramic materials.