The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Apr. 10, 2013
Applicant:

Saint-gobain Glass France, Courbevoie, FR;

Inventors:

Valentin Schulz, Aachen, DE;

Lutz Hermanns, Moenchengladbach, DE;

Lars Pape, Eschweiler, DE;

Stephan Kremers, Heinsberg, DE;

Assignee:

SAINT-GOBAIN GLASS FRANCE, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01); G01N 21/88 (2006.01); G01N 21/896 (2006.01); G01N 21/958 (2006.01); G01L 1/24 (2006.01); G01N 33/38 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01L 1/241 (2013.01); G01N 21/896 (2013.01); G01N 21/958 (2013.01); G01N 33/386 (2013.01); G01N 2021/8848 (2013.01);
Abstract

A method for measuring blowing structures of a prestressed disc is described. The method has the steps of: (a) irradiating at least one analysis area of the disc with linearly polarized light from a radiation source at an angle of incidence and recording an image at least of the analysis area at an angle of observation using at least one detector, (b) supplying the image to an evaluation unit, and (c) using the evaluation unit to read a brightness profile along an analysis line on the image, to determine the local maxima and the local minima of the brightness profile, and to determine an intensity index by means of the difference between a brightness mean of the local maxima and a brightness mean of the local minima.


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