The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Oct. 22, 2013
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Kevin George Harding, Niskayuna, NY (US);

Yi Liao, Niskayuna, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01N 3/08 (2006.01); G01D 5/347 (2006.01); G01B 11/00 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01B 11/00 (2013.01); G01B 11/16 (2013.01); G01B 11/165 (2013.01); G01D 5/347 (2013.01); G01L 1/246 (2013.01); G01N 2203/0071 (2013.01); G01N 2203/0647 (2013.01);
Abstract

A method and system for monitoring creep in an object are provided. The creep monitoring system includes a creep sensor assembly that includes at least one image pattern pair disposed on a surface of the object. The creep monitoring method includes receiving information from the creep sensor assembly regarding an observed creep and an offset associated with the object, correcting the observed creep using the information regarding the offset and outputting the corrected information relative to the creep.


Find Patent Forward Citations

Loading…