The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 2015
Filed:
Mar. 23, 2012
Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation
Applicants:
Robert J. Faus, Longmont, CO (US);
Leonid G. Feldman, Broomfield, CO (US);
Alexander F. H. Goetz, Boulder, CO (US);
Inventors:
Robert J. Faus, Longmont, CO (US);
Leonid G. Feldman, Broomfield, CO (US);
Alexander F. H. Goetz, Boulder, CO (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01J 3/28 (2006.01); G01J 3/06 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01J 3/06 (2013.01);
Abstract
A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.