The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Mar. 28, 2013
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chao-Chuang Mai, Taichung, TW;

Chih-Ping Cheng, Miaoli County, TW;

Chang-Sheng Chen, Kaohsiung, TW;

Chin-Hui Chen, Taichung, TW;

Chia-Sheng Chiang, Changhua County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/09 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/0923 (2013.01);
Abstract

A method and a system, for offsetting measurement of machine tool, includes following steps. A tool seat is chosen, a first coordinate is set based on a first datum mark of the tool seat. There is a total tool seat assembling length in between the first datum mark and the tool seat. A tool is chosen, assembled in the tool seat, and includes a total tool length. A second coordinate is set based on a second datum mark of a measuring unit. The tool seat is moved to make a machining end of the tool contact with the second coordinate to obtain a relative total length in between the first and the second coordinate. The total tool length subtracts from the relative total length equals an assembled offset length. The total tool seat assembling length subtracts from the relative total length equals and obtains a tool assembling length.


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