The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Feb. 07, 2013
Applicant:
Stmicroelectronics S.r.l, Agrate Brianza, IT;
Inventors:
Paolo Pasteris, Agrate Brianza, IT;
Giovanni Condello, Pavia, IT;
Danilo Pietro Pau, Sesto San Giovanni, IT;
Assignee:
STMicroelectronics S.r.l., Agrate Brianza, IT;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); H04N 19/124 (2014.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01); H04N 19/13 (2014.01); H04N 19/91 (2014.01);
U.S. Cl.
CPC ...
H04N 7/26079 (2013.01); G06K 9/00523 (2013.01); G06K 9/00671 (2013.01); G06K 9/46 (2013.01); G06K 9/4671 (2013.01); G06K 9/6218 (2013.01); H04N 19/124 (2014.11); H04N 19/13 (2014.11); H04N 19/91 (2014.11);
Abstract
One embodiment is a method for selecting and grouping key points extracted by applying a feature detector on a scene being analyzed. The method includes grouping the extracted key points into clusters that enforce a geometric relation between members of a cluster, scoring and sorting the clusters, identifying and discarding clusters that are comprised of points which represent the background noise of the image, and sub-sampling the remaining clusters to provide a smaller number of key points for the scene.