The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Mar. 11, 2013
Applicant:

Dainippon Screen Mfg. Co., Ltd., Kyoto, JP;

Inventors:

Hiroki Fujimoto, Kyoto, JP;

Masayoshi Kobayashi, Kyoto, JP;

Takashi Miyake, Kyoto, JP;

Sanzo Moriwaki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G01N 21/253 (2013.01); G01N 21/255 (2013.01); G01N 2201/067 (2013.01); G01N 2201/0631 (2013.01); G01N 2201/0634 (2013.01);
Abstract

A preliminary image is obtained by irradiating illumination light, whose light quantity distribution is set at a standard state, to a specimen obtained by injecting fluid into a well from an illuminator capable of arbitrarily setting the light quantity distribution, for example, by a liquid crystal shutter, and a luminance distribution of the preliminary image is detected. As a result, luminance nonuniformity in the preliminary image is canceled by performing imaging with a light quantity distribution of illumination light to be incident on the well set such that an incident light amount is larger in a part with lower luminance.


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