The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Jul. 18, 2013
Applicant:

Globalfoundries U.s. 2 Llc, Hopewell Junction, NY (US);

Inventors:

Yulei Liu, St Leonards, AU;

Daniel Joseph Martin, Pawling, NY (US);

Piyush Sarwal, Leawood, KS (US);

Assignee:

GlobalFoundries Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/703 (2013.01);
U.S. Cl.
CPC ...
H04L 45/28 (2013.01);
Abstract

A method, system, and computer program product for locating a network fault are provided in the illustrative embodiments. A set of network probes is configured to execute at a corresponding set of networking components in a data network. A set of events is received. An event in the set of events includes a list of network probes in an order those network probes are visited, the list of network probes forming a path in a set of paths. A test is performed to determine whether a fault condition is present in any of the paths. Those paths are selected, as a set of candidate paths, where the fault condition is present. At least one segment of a specified length is located that is common to a threshold number of paths in the set of candidate paths. The located segment is suggested as the location of the network fault.


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