The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Sep. 28, 2012
Applicant:

Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;

Inventors:

Dong Yang, Shanghai, CN;

Yujie Zhu, Shanghai, CN;

Yanbing Yu, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 11/00 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04L 27/2659 (2013.01);
Abstract

A method and apparatus for performing time synchronization and an OFDMA receiver thereof are provided. The method preferably includes performing a differential phase correlation in a frequency domain based on one received sequence and one reference preamble and detecting an integer frequency offset based on a result of the differential phase correlation. The method and apparatus advantageously enable the use of one OFDM symbol to estimate ICFO and the use of a simple method to facilitate ICFO detection. Moreover, the performance of the integer frequency offset estimation becomes more robust in high noise and time-variant fading channels, with reduced hardware complexity.


Find Patent Forward Citations

Yang, Dong. (2015). Method and apparatus for integer frequency offset estimation in wireless communication system (U.S. Patent No. 9203675). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9203675

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…