The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Sep. 27, 2013
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Satoshi Matsubara, Kawasaki, JP;

Hideharu Shako, Yokohama, JP;

Mitsuharu Hamano, Sendai, JP;

Kazuo Nagatani, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 1/00 (2006.01); H04B 1/04 (2006.01);
U.S. Cl.
CPC ...
H04B 1/0475 (2013.01);
Abstract

A delay quantity estimation apparatus comprises a first correlation value arithmetic unit to calculate a first correlation value as a correlation value between a first input signal and a feedback signal delayed with a first delay value; a second correlation value arithmetic unit to calculate a second correlation value as a correlation value between the first input signal and a feedback signal delayed with a second delay value; and a delay quantity estimation unit to estimate a delay quantity of the feedback signal with respect to the input signal on the basis of the first difference value as a difference between the first correlation value and the second correlation value, wherein the second delay value is a value given by adding a certain value to the first delay value.


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