The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Oct. 26, 2012
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Hyo-Sook Jang, Hwaseong-si, KR;

Hyun-A Kang, Suwon-si, KR;

Eun-Joo Jang, Suwon-si, KR;

Shin Ae Jun, Seongnam-si, KR;

Tae Won Jeong, Yongin-si, KR;

In Taek Han, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 5/16 (2006.01); B05D 7/00 (2006.01); H01L 33/56 (2010.01); C09C 3/00 (2006.01); C09C 3/10 (2006.01); H01L 33/50 (2010.01);
U.S. Cl.
CPC ...
H01L 33/56 (2013.01); C09C 3/006 (2013.01); C09C 3/10 (2013.01); H01L 33/502 (2013.01); H01L 33/501 (2013.01); H01L 33/507 (2013.01); Y10T 428/2989 (2015.01); Y10T 428/2998 (2015.01);
Abstract

A semiconductor nanocrystal-polymer micronized composite that includes: at least one semiconductor nanocrystal; and a polymer surrounding the at least one semiconductor nanocrystal, wherein the polymer includes at least one functional group reactive with the semiconductor nanocrystal, and wherein the semiconductor nanocrystal-polymer micronized composite has a particle diameter of less than or equal to about 70 micrometers (μm) with a standard deviation of less than or equal to about 20 micrometers (μm), and an aspect ratio of more than about 1.0 and less than or equal to about 10.


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