The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Apr. 26, 2012
Applicants:

Andreas Löffler, Regensburg, DE;

Christian Leirer, Regensburg, DE;

Rainer Butendeich, Regensburg, DE;

Tobias Meyer, Ihrlerstein, DE;

Matthias Peter, Regensburg, DE;

Inventors:

Andreas Löffler, Regensburg, DE;

Christian Leirer, Regensburg, DE;

Rainer Butendeich, Regensburg, DE;

Tobias Meyer, Ihrlerstein, DE;

Matthias Peter, Regensburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/24 (2006.01); H01L 33/26 (2010.01); H01L 33/02 (2010.01); H01L 33/14 (2010.01); H01L 33/24 (2010.01); H01L 33/32 (2010.01);
U.S. Cl.
CPC ...
H01L 33/26 (2013.01); H01L 33/025 (2013.01); H01L 33/14 (2013.01); H01L 33/24 (2013.01); H01L 33/32 (2013.01);
Abstract

A radiation-emitting semiconductor chip having a semiconductor layer sequence based on a nitride compound semiconductor material and having a pn junction includes a first protective layer having deliberately introduced crystal defects, a second protective layer having a higher doping than the first protective layer, wherein the first protective layer protects the semiconductor chip against electrostatic discharge pulses, an active zone that generates radiation disposed downstream of the first protective layer in a growth direction, wherein during operation of the semiconductor chip, a breakdown behavior of the semiconductor layer sequence in a reverse direction in regions having crystal defects differs from regions without crystal defects, and wherein in the event of electrostatic discharge pulses, electrical charge is dissipated in a homogeneously distributed manner via the regions having crystal defects.


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