The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Jan. 20, 2014
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Yoshinori Tsuchiya, Nagoya, JP;

Shinichi Hoshi, Okazaki, JP;

Masaki Matsui, Nagoya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); H01L 21/67 (2006.01); H01L 21/311 (2006.01); H01L 21/3065 (2006.01); H01J 37/32 (2006.01); H01L 21/306 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 29/778 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67069 (2013.01); H01J 37/321 (2013.01); H01L 21/3065 (2013.01); H01L 21/30621 (2013.01); H01L 21/31116 (2013.01); H01L 29/4236 (2013.01); H01L 29/66462 (2013.01); H01L 29/7787 (2013.01); H01J 2237/334 (2013.01); H01L 29/2003 (2013.01);
Abstract

A manufacturing method of a semiconductor device including arranging a compound semiconductor above a stage of a chamber, supplying an etching gas into the chamber, and generating a plasma in the chamber is provided. The compound semiconductor includes a group-III element nitride as a main component. A surface of the compound semiconductor is processed by a dry etching. Light is irradiated into the chamber during the generating of the plasma. A dry etching apparatus including a chamber including a stage, on which a compound semiconductor is mounted, and a light source irradiating light into the chamber is provided. The chamber is supplied with an etching gas. A plasma is generated in the chamber. A surface of the compound semiconductor is an object of a dry etching.


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