The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Nov. 28, 2012
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventors:

John Lawrence Campbell, Milton, CA;

James Hager, Mississauga, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); H01J 49/4215 (2013.01);
Abstract

In some embodiments, a quantitative analysis of at least one ion signal associated with a sample, which is detected by a mass spectrometer having at least two tandem quadrupole instruments, is employed to select one of the following operational modes for further mass analysis of the sample: (a) utilizing both quadrupole instruments as mass resolving filters, and (b) utilizing one quadrupole instrument as a mass resolving filter and utilizing the other as a linear ion trap. In some embodiments, the quantitative analysis of the ion signal comprises comparing the ion signal intensity with a predefined threshold.


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