The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
May. 10, 2013
Applicant:
Omnivision Technologies, Inc., Santa Clara, CA (US);
Inventors:
Johannes Solhusvik, Haslum, NO;
Kristoffer Ellersgaard Koch, Oslo, NO;
Sohrab Yaghmai, Oslo, NO;
Jenny Picalausa, Hakadal, NO;
Assignee:
OmniVision Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/08 (2006.01); G11C 29/04 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 2029/0401 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/2602 (2013.01);
Abstract
A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.