The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

May. 10, 2013
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventors:

Johannes Solhusvik, Haslum, NO;

Kristoffer Ellersgaard Koch, Oslo, NO;

Sohrab Yaghmai, Oslo, NO;

Jenny Picalausa, Hakadal, NO;

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/08 (2006.01); G11C 29/04 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 2029/0401 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/2602 (2013.01);
Abstract

A method for testing an electronic memory while the memory is in use includes: (a) detecting an access to the electronic memory at a test address, (b) saving, in a register subsystem, write data written to the electronic memory at a location corresponding to the test address, (c) comparing the write data to data read from the electronic memory at the location corresponding to the test address to determine whether the memory has a fault, and (d) generating an error signal if the memory has a fault.


Find Patent Forward Citations

Solhusvik, Johannes. (2015). On-line memory testing systems and methods (U.S. Patent No. 9202591). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9202591

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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