The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Sep. 28, 2012
Rony R. Baenziger, Palm Coast, FL (US);
Hanna Yehuda, Ra'anana, IL;
Gary K. Roberts, Lexington, MA (US);
Joanne Hubbard, Concord, MA (US);
Mark A. Arakelian, Shirley, MA (US);
Katarzyna Leskow, Hanover, MA (US);
Rony R. Baenziger, Palm Coast, FL (US);
Hanna Yehuda, Ra'anana, IL;
Gary K. Roberts, Lexington, MA (US);
JoAnne Hubbard, Concord, MA (US);
Mark A. Arakelian, Shirley, MA (US);
Katarzyna Leskow, Hanover, MA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
A system provides for display of results from performance data analysis that presents mini-chart overlays on a topology map based on intelligent analytics for components in a I/O data path of a host or other object. The mini-charts may be advantageously used to show criticality of impact to assist a user with incident avoidance and/or to provide fast incident resolution. When launching into the topology map, the user may enable mini-charts and visually see from the charts where a possible performance bottleneck is detected by the analytics. In an embodiment, the mini-charts for the most relevant metrics may be displayed and identified for criticality, such as by color. The colors may be determined by thresholds, that may be set by a user and/or determined by the system, and may be calculated automatically based on learned base line, maximum line and minimum line operations over set times.