The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Aug. 11, 2014
International Business Machines Corporation, Armonk, NY (US);
Hao Chen, Beijing, CN;
Claudio Cozzi, Foster City, CA (US);
Ya Bin Dang, Beijing, CN;
Howard M. Hess, Winnetka, IL (US);
Steven M. Kagan, Burr Ridge, IL (US);
Feng Li, Beijing, CN;
Shao Chun Li, Beijing, CN;
Jeffrey L. Robinson, Dearborn, MI (US);
Xin Zhou, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for impact analysis of change requests of a computing system is provided. The method includes, identifying artifacts and tasks that are impacted by a change request on a target project based on a change request repository, an artifact dependency network and a task-artifact mapping repository. The method further includes, determining an impact analysis priority for each of the identified tasks based on associations among the change request and the identified artifacts and tasks, and a project status tracking repository. The method further includes analyzing an impact of the change request on each of the identified tasks according to the determined impact analysis priority. The method further includes obtaining requirements, requirement dependencies and requirement constraints of the project scope to identifying artifacts and tasks that are impacted by a change request on the target project of the project scope.