The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Jun. 27, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Mark Chamness, Menlo Park, CA (US);
Eric Schnegelberger, Youngsville, NC (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01);
Abstract
A method, article of manufacture, and apparatus for identifying and resolving defects in multiple clusters based on a reported defect instance is discussed. Computer systems may be grouped into clusters. A report of a defective system may be received, and the defective system's cluster may be identified. A defect solution may then be distributed to all the systems in that cluster.