The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Jun. 28, 2011
Applicant:

Takao Takenouchi, Tokyo, JP;

Inventor:

Takao Takenouchi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); H04L 29/06 (2006.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 17/30312 (2013.01); G06F 21/554 (2013.01); H04L 63/04 (2013.01); G06F 2221/2117 (2013.01);
Abstract

An attribute information processing device includes: an attribute information acquiring unit that acquires attribute information; an attribute value acquiring unit that acquires at least two types of attribute values including a first-type attribute value and a second-type attribute value corresponding to an attribute value of the acquired attribute information; a generating unit that determines a function for obtaining an evaluation value from the acquired two or more types of attribute values, determines a acquisition source of the first-type attribute value to be a first-attribute providing device that can provide the first-type attribute value concerning attribute information serving as a comparison target, determines an acquisition source of the second-type attribute value to be a second-attribute providing device different from the first-attribute providing device, and generates attribute evaluation information containing information on the function, an evaluation value, information for identifying the first-attribute providing device, and information for identifying the second-attribute providing device; and an output unit that outputs the second-type attribute value and the attribute evaluation information.


Find Patent Forward Citations

Takenouchi, Takao. (2015). Attribute information processing device, attribute information processing method and attribute information evaluation system (U.S. Patent No. 9201915). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9201915

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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