The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
May. 31, 2013
The Mathworks, Inc., Natick, MA (US);
David Hruska, Chestnut Hill, MA (US);
Andrew T. Campbell, Medway, MA (US);
David M. Saxe, Stow, MA (US);
David A. Foti, Holliston, MA (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
A device receives a first test class associated with a first fixture. The first test class includes first method(s) to test portion(s) of dynamically-type programming code, and the first fixture defines first environment(s) for the first method(s). The device receives a second test class associated with the first fixture and a second fixture. The second test class includes second method(s) to test the code portion(s). The first fixture defines the first environment(s) for the second method(s), and the second fixture defines second environment(s) for the second method(s). The device combines the first method(s) of the first test class and the second method(s) of the second test class to create a test group, and analyzes the test group to determine whether the test group is correctly organized based on the first fixture and the second fixture. The device provides a reorganized test group when the test group is incorrectly organized.