The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Jul. 31, 2013
International Business Machines Corporation, Armonk, NY (US);
Asaf Adi, Qiryat Ata, IL;
Sarit Arcushin, Haifa, IL;
Peter Bak, Haifa, IL;
Dolev Dotan, Oshrat, IL;
Alexander Kofman, Haifa, IL;
Avi Yaeli, Ramot Menashe, IL;
Tali Yatzkar-Haham, Misgav, IL;
Gilad Saadoun, Haifa, IL;
Guy Sharon, Rehovot, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computerized method for generating monitoring rules, comprising: presenting to a user a spatio-temporal data indicative of a plurality of spatio-temporal attributes of a plurality of image objects in a space during a period; selecting, by a user, at least one of a spatial pattern and a temporal pattern represented in said spatio-temporal data; analyzing said at least one of a spatial pattern and a temporal pattern to identify at least one of a spatial related characteristic of at least some of said plurality of image objects and a temporal related characteristic of at least some of said plurality of image objects; automatically generating at least one monitoring rule to track an occurrence of said at least one of a location related characteristic and a temporal related characteristic.