The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Dec. 27, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Eiichi Tanaka, Yokohama, JP;

Takayuki Komatsu, Yokohama, JP;

Keiichi Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 13/00 (2006.01); H04N 5/225 (2006.01); G03B 13/36 (2006.01); H04N 5/232 (2006.01); H04N 5/369 (2011.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G03B 13/36 (2013.01); G02B 3/0056 (2013.01); H04N 5/2254 (2013.01); H04N 5/23209 (2013.01); H04N 5/23212 (2013.01); H04N 5/3696 (2013.01);
Abstract

Disclosed are an image capture apparatus in which an arrangement relationship between an image sensor and a microlens array that is arranged in front of the image sensor can be varied, and a method for controlling the same. In a state in which a photographic lens including the microlens array is attached, information on the photographic lens and information on the image sensor are used to control a distance between the microlens array and the image sensor, and an aperture value. The microlens array or the image sensor is shifted so that they are arranged at this distance, and the aperture value is set.


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