The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Mar. 07, 2014
Applicant:
Yee-chung Fu, Fremont, CA (US);
Inventor:
Yee-Chung Fu, Fremont, CA (US);
Assignee:
ADVANCED NUMICRO SYSTEMS, INC., Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G02B 26/101 (2013.01); G02B 26/0841 (2013.01);
Abstract
A two-dimensional electrostatic scanner with distributed springs is disclosed. The two-dimensional electrostatic scanner comprises a frame, a mirror, one or more first-directional comb drives, two or more second-directional comb drives, four or more first-directional springs, and two or more second-directional springs. The four or more first-directional springs may connect to different electrical voltage source or electrical ground.
Fu, Yee-Chung. (2015). Two-dimensional electrostatic scanner with distributed springs (U.S. Patent No. 9201239). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9201239
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile