The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Sep. 23, 2011
Applicants:
Thomas Schenker, Zofingen, CH;
Beat Von Aesch, Schoenenwerd, CH;
Thomas Liebi, Rothrist, CH;
Inventors:
Assignee:
Muller Martini Holding AG, Hergiswil, CH;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/09 (2006.01); B42B 4/00 (2006.01); B82Y 25/00 (2011.01);
U.S. Cl.
CPC ...
G01R 33/093 (2013.01); B42B 4/00 (2013.01); B82Y 25/00 (2013.01);
Abstract
A method for continuous quality control of geometric, structural and functional parameters of an applied element, such as a staple, in printed products. The quality control is realized with the aid of at least one measuring device that comprises at least one measuring head including at least one permanent magnet and at least one giant magneto resistance sensor chip. The applied element is detected with the measuring head and, based thereon, a magnetic image is generated of the condition of the element.