The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Feb. 17, 2009
Philippe Garreau, Paris, FR;
Per Iversen, Doylestown, PA (US);
Arnaud Gandois, Breuillet, FR;
Luc Duchesne, Angervilliers, FR;
Philippe Garreau, Paris, FR;
Per Iversen, Doylestown, PA (US);
Arnaud Gandois, Breuillet, FR;
Luc Duchesne, Angervilliers, FR;
Microwave Vision, , FR;
Abstract
The invention relates to a device () for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (), characterized in that it comprises a means () for sliding said probe network () on itself with a relative offset between the probe network () and the object being tested, that is higher than the pitch of the probe network () in order to carry out measurements along a plurality of relative positions of the probe network () and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network () relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.