The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Dec. 27, 2012
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); G01R 27/28 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 27/28 (2013.01); G01R 29/26 (2013.01); G01R 31/2853 (2013.01); G01R 31/31708 (2013.01); G01R 31/31717 (2013.01);
Abstract
Second signal lines are selected among neighboring signal lines near a first signal line, such that the second signal lines have valid coupling capacitances with respect to the first signal line. Test signal patterns of the first signal line and the second signal lines are selected among real signal patterns according to a function of the integrated circuit. At least one of a coupling noise and a coupling transition delay of the first signal line is calculated based on the test signal patterns.
Quick Actions:
Yun, Yeo-Il. (2015). Method of analyzing coupling effect between signal lines in an integrated circuit (U.S. Patent No. 9201108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9201108
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