The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Mar. 10, 2011
Applicant:

Yuji Wakamiya, Kobe, JP;

Inventor:

Yuji Wakamiya, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 33/00 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 2035/00851 (2013.01); Y10T 436/2575 (2015.01);
Abstract

A sample analyzer for performing analysis regarding a predetermined measurement item by using a combination of at least a first reagent and a second reagent, the sample analyzer comprising: a reagent container holder configured to hold a first reagent container which contains the first reagent and which includes a first storage medium, and a second reagent container which contains the second reagent and which includes a second storage medium; a writer configured to write information into the first storage medium and the second storage medium; and a controller configured to control the writer to write, into the first storage medium of the first reagent container, identification information for identifying the second reagent container which is paired with the first reagent container is disclosed. A reagent management method is also disclosed.


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