The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Aug. 30, 2011
Ifeanyi Charles Ume, Atlanta, GA (US);
Tsun-yen Wu, Atlanta, GA (US);
Ifeanyi Charles Ume, Atlanta, GA (US);
Tsun-Yen Wu, Atlanta, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
A system and method for measuring various weld characteristics is presented. The system and method can comprise a means to measure penetration depth of butt welds in thin plates, for example, using laser generated ultrasounds. Superimposed line sources (SLS) can be used to generate narrowband ultrasounds. A signal processing procedure that combines wavenumber-frequency (k-ω) domain filtering and synthetic phase tuning (SPT) is used to reduce the complexity of Lamb wave signals. The reflection coefficients for different wavelengths corresponding to each wave mode can be calculated. Regression analysis that can include stepwise regression and corrected Akaike's information criterion (AIC) can be performed to build prediction models that use the reflection coefficients as predictors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile