The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Jun. 26, 2013
Applicant:

Universite Laval, Québec, CA;

Inventors:

Gabrielle Thériault, Québec, CA;

Yves De Koninck, Québec, CA;

Nathalie McCarthy, Québec, CA;

Assignee:

UNIVERSITE LAVAL, Québec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01N 21/6458 (2013.01); G02B 21/002 (2013.01); G02B 26/101 (2013.01); G02B 26/105 (2013.01);
Abstract

A laser scanning imaging system and method for obtaining an extended-depth-of-field image of a volume of a sample are provided. The system includes a laser module generating an input laser beam, a beam shaping module including an axicon and a Fourier-transform lens, and an imaging module including an objective lens and a detecting assembly. The axicon, Fourier-transform lens and objective lens are formed and disposed to successively convert the input laser beam into an intermediate non-diffracting beam, an intermediate annular beam, and an excitation non-diffracting beam. The excitation beam is projected onto the sample and has a depth of field and transverse resolution together defining a three-dimensional excitation region. The detecting assembly collects electromagnetic radiation from the excitation region to obtain one pixel of the extended-depth-of-field image. The system further includes a two-dimensional scanning module for scanning the excitation beam over the sample and build, pixel-by-pixel, the extended-depth-of-field image.


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