The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Jul. 30, 2012
Applicant:
Ludmila L. Danylewych-may, North York, CA;
Inventor:
Ludmila L. Danylewych-May, North York, CA;
Assignee:
SMITHS DETECTION, Mississauga, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/02 (2006.01); G01N 1/40 (2006.01); A61B 10/00 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
G01N 1/405 (2013.01); A61B 10/0045 (2013.01); G01N 1/02 (2013.01); A61B 10/0051 (2013.01); G01N 27/622 (2013.01); G01N 2001/022 (2013.01); G01N 2001/028 (2013.01);
Abstract
A sampling swab useful in trace analyte detection is provided. The sampling swab possesses absorption/adsorption and desorption properties suitable for use trace analyte sample collection. The sampling swab is also capable of withstanding repeated high heat treatment and mechanical stress. A method for producing a sampling swab that is substantially free of impurities and detection interferants is also provided.