The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Aug. 14, 2012
Zhiling Xu, West Windsor, NJ (US);
Michael H. Brill, Kingston, NJ (US);
Zhiling Xu, West Windsor, NJ (US);
Michael H. Brill, Kingston, NJ (US);
Datacolor Holding AG, Luzern, CH;
Abstract
One embodiment of a method for aligning measurements taken by a plurality of color measurement instruments with measurements taken by an industry standard color measurement instrument includes receiving a first set of spectral data from the plurality of instruments, receiving a second set of spectral data from the industry standard instrument, generating initial profiles for the plurality of instruments (by producing, for each given instrument, a first correction that aligns the spectral data taken by the given instrument with the second set of spectral data), mathematically correcting the first set of spectral data using the initial profiles to produce a third set of spectral data, and generating new profiles for the plurality of instruments (by calculating a mean of the third set of spectral data, and producing, for each given instrument, a second correction that aligns the spectral data taken by the given instrument with the mean.