The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Dec. 01, 2014
Bertec Corporation, Columbus, OH (US);
Todd Christopher Wilson, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A measurement and testing system comprising a plurality of measurement assemblies and a data acquisition and processing device is disclosed. Each of the plurality of measurement assemblies includes a measurement surface for receiving at least one portion of a body of a subject; and at least one measurement device configured to sense one or more measured quantities and output one or more signals that are representative of the one or more measured quantities. In one embodiment, the data acquisition and processing device is configured to determine whether a load is being applied to a particular one of the plurality of measurement assemblies by a first or second body portion of the subject. In another embodiment, the data acquisition and processing device is configured to construct a first virtual measurement assembly from a first subset of measurement assemblies and a second virtual measurement assembly from a second subset of measurement assemblies.