The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Dec. 13, 2011
Applicant:

J. Ward Macarthur, Scottsdale, AZ (US);

Inventor:

J. Ward MacArthur, Scottsdale, AZ (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); C02F 1/00 (2006.01); G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
C02F 1/008 (2013.01); G05B 13/048 (2013.01);
Abstract

A method includes receiving data associated with operation of an industrial process system. The method also includes identifying a model defining a behavior of the industrial process system using the data, an orthonormal bases function, and an ordinal spline bases function. The orthonormal bases function can be generated using estimated poles of the industrial process system. The ordinal spline bases function can be generated using a specified set of cubic splines. The ordinal spline bases function can also be generated using a distribution of knots and multiple ordinal spline functions associated with the knots. More knots can be associated with a more nonlinear portion of the industrial process system, and fewer knots can be associated with a less nonlinear portion or a linear portion of the industrial process system.


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