The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9198594 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 01, 2015

Filed:

Jan. 08, 2014
Applicant:

Nihon Kohden Corporation, Shinjuku-ku, Tokyo, JP;

Inventors:

Tsuneo Takayanagi, Tokyo, JP;

Takashi Kaiami, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0452 (2006.01); A61B 5/0472 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0452 (2013.01); A61B 5/0472 (2013.01); A61B 5/04525 (2013.01);
Abstract

A TWA measuring apparatus includes: a T-wave feature quantity measuring section; a classifying section classifying T-wave feature quantities into groups of odd and even electrocardiogram waveforms; a reliability index calculating section calculating: first and second representative values and first and second dispersion values of the T-wave feature quantities in the odd and even group; a difference between the first and second representative values, to obtain a TWA feature quantity; and an adjustment value between the first representative value and the first dispersion value, and an adjustment value between the second representative value and the second dispersion value, to obtain a reliability index; and a reliability recognizing section recognizing: when the reliability index exceeds a threshold, that reliability of the TWA feature quantity is high; and when the reliability index does not exceed the threshold, that the reliability is low.


Find Patent Forward Citations

Takayanagi, Tsuneo. (2015). Twa measuring apparatus and twa measuring method (U.S. Patent No. 9198594). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9198594

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