The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Nov. 11, 2011
Applicants:

Hiroaki Ueda, Otsu, JP;

Takahisa Fujimoto, Settsu, JP;

Kozo Kondo, Otsu, JP;

Kenji Yamamoto, Settsu, JP;

Inventors:

Hiroaki Ueda, Otsu, JP;

Takahisa Fujimoto, Settsu, JP;

Kozo Kondo, Otsu, JP;

Kenji Yamamoto, Settsu, JP;

Assignee:

KANEKA CORPORATION, Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/042 (2006.01); B32B 7/02 (2006.01); B32B 17/10 (2006.01); H01L 21/44 (2006.01); H01J 1/62 (2006.01); H01J 63/04 (2006.01); H01L 33/00 (2010.01); B32B 15/00 (2006.01); B32B 17/06 (2006.01); H05K 1/03 (2006.01); C23C 14/08 (2006.01); G02B 1/116 (2015.01); G06F 3/041 (2006.01); H05K 3/46 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0306 (2013.01); C23C 14/08 (2013.01); G02B 1/116 (2013.01); G06F 3/041 (2013.01); H05K 3/4688 (2013.01); G06F 3/044 (2013.01); G06F 2203/04103 (2013.01);
Abstract

The substrate with a transparent electrode includes a first dielectric material layer mainly composed of SiO, a second dielectric material layer mainly composed of a metal oxide, a third dielectric material layer mainly composed of SiO, and a transparent electrode layer, in this order on a transparent film substrate. The transparent electrode layer is patterned to have an electrode layer-formed part and an electrode layer non-formed part. The transparent electrode layer is a layer mainly composed of an indium-tin composite oxide and having a thickness of 20 nm to 35 nm. The refractive index nof the first dielectric material layer, the refractive index nof the second dielectric material layer, and the refractive index nof the third dielectric material layer satisfy n<n<n. The first dielectric material layer, the second dielectric material layer and the third dielectric material layer each have specific thicknesses.


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