The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Jul. 26, 2013
National Chung Cheng University, Chiayi County, TW;
Huei-Yung Lin, Chia-Yi, TW;
Chun-Lung Tsai, Tainan, TW;
National Chung Cheng University, Chiayi County, TW;
Abstract
A measurement method for environment depth and the image extraction device thereof is revealed. First, rotate an image extraction unit and extract a plurality of images using an image extraction device according to different viewing angles of a target object. Then, use disparity information of the plurality of images and an image parameter of the image extraction unit to give a plurality pieces of depth-of-field information, which are further used for giving environment depth information. The image extraction device has an image extraction unit and a rotating member. The rotating member is connected with the base; the rotating member is connected to the image extraction unit, which is located on one side of the rotating member. The plurality of images with different viewing angles are extracted to the image extraction unit as the rotating member rotates about a rotating center to different image extracting locations.