The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Nov. 21, 2012
Applicant:

University of Connecticut;

Inventors:

Bahram Javidi, Storrs, CT (US);

Manuel Martinez-Corral, Betera, ES;

Raul Martinez-Cuenca, Torrente, ES;

Genaro Saavedra-Tortosa, Manises, ES;

Hector Navarro Fructuoso, Alicante, ES;

Assignees:

UNIVERSITAT DE VALÉNCIA, Valencia, ES;

UNIVERSITY OF CONNECTICUT, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 3/00 (2006.01); H04N 13/00 (2006.01); G02B 27/22 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0203 (2013.01); G02B 27/22 (2013.01); G06T 3/00 (2013.01); H04N 13/0007 (2013.01);
Abstract

A smart pseudoscopic to orthoscopic conversion (SPOC) protocol, and method for using the SPOC protocol for three-dimensional imaging, are disclosed. The method allows full control over the optical display parameters in Integral Imaging (InI) monitors. From a given collection of elemental images, a new set of synthetic elemental images (SEIs) ready to be displayed in an InI monitor can be calculated, in which the pitch, microlenses focal length, number of pixels per elemental cell, depth position of the reference plane, and grid geometry of the microlens array (MLA) can be selected to fit the conditions of the display architecture.


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