The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Sep. 12, 2012
Applicants:

Olusanya T. Soyannwo, Cupertino, CA (US);

Samuel Henry Chang, San Jose, CA (US);

Edward Dietz Crump, Santa Cruz, CA (US);

Weijian Wang, Cupertino, CA (US);

Renwei Yan, Sunnyvale, CA (US);

Ning Yao, Cupertino, CA (US);

Inventors:

Olusanya T. Soyannwo, Cupertino, CA (US);

Samuel Henry Chang, San Jose, CA (US);

Edward Dietz Crump, Santa Cruz, CA (US);

Weijian Wang, Cupertino, CA (US);

Renwei Yan, Sunnyvale, CA (US);

Ning Yao, Cupertino, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/14 (2006.01); H04N 9/31 (2006.01); G03B 3/00 (2006.01); A63F 13/00 (2014.01);
U.S. Cl.
CPC ...
H04N 9/3194 (2013.01); G03B 3/00 (2013.01); G03B 21/14 (2013.01); A63F 13/00 (2013.01); H04N 9/3185 (2013.01);
Abstract

Techniques are described for performing automatic focusing of a projected image on a mobile projection surface. Specific regions of the projected image are identified that are likely to be desired to stay in optimal focus, and attributes of those specific regions, such as sharpness and contrast, can be used to determine the need to refocus the image. Advanced knowledge of the image data being projected can be utilized to determine the specific regions of the projected image that require monitoring for optimal focusing.


Find Patent Forward Citations

Loading…