The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Feb. 11, 2014
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Garry Chinn, San Mateo, CA (US);
Peter D. Olcott, Los Gatos, CA (US);
Craig Steven Levin, Palo Alto, CA (US);
Ewout Van Den Berg, Bronxville, NY (US);
Carlos Alberto Sing-Long Collao, Stanford, CA (US);
Emmanuel J. Candes, Stanford, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A method for providing an image from a device with a plurality of sensors and a plurality of time to digital converters (TDC) is provided. Data signals are generated by some of the plurality of sensors, wherein each sensor of the plurality of sensors provides output in parallel to more than one TDC of the plurality of TDCs and wherein each TDC of the plurality of TDCs receives in parallel input from more than one sensor of the plurality of sensors and where a binary matrix indicates which sensors are connected to which TDC. The data signals are transmitted from the sensors to the TDCs. TDC signals are generated from the data signals. Group testing is used to decode the TDC signals based on the binary matrix.