The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Jul. 25, 2011
Yasuhiro Yamasaki, Tokyo, JP;
Yoichi Hatano, Tokyo, JP;
Yasuhiro Yamasaki, Tokyo, JP;
Yoichi Hatano, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Provided is a quality-deteriorated part analyzing system capable of analyzing a quality-deteriorated part in a network while increasing the degree of freedom of precision (coverage ratio, sectioning divisions, etc.) independently of the number and installation locations of devices transmitting and receiving flows. Path calculation meansdetermines paths, each passing through one or more directed links between nodes in the network and being regarded as a target of communication quality measurement, and generates a path table which indicates directed links included in each communication quality measurement target section. Quality measurement meansmeasures communication quality based on the flows corresponding to the paths determined by the path calculation means. Analysis meansanalyzes a communication quality-deteriorated part in the directed links in the network based on the path table and the communication quality.