The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

May. 28, 2014
Applicant:

Lsi Corporation, San Jose, CA (US);

Inventors:

Vladimir Sindalovsky, Warrington, PA (US);

Lane A. Smith, Easton, PA (US);

Niall Fitzgerald, Dublin, IR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01); H04L 27/01 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03159 (2013.01); H04L 25/03057 (2013.01); H04L 25/03312 (2013.01); H04L 27/01 (2013.01); H04L 2025/03592 (2013.01);
Abstract

Described embodiments provide for, in a receiver circuit employing a data latch, circuitry to adjust trim offset of the data latch to account for latch functional features (e.g., hysteresis and metastability) that may interact with trim of the latch. In accordance with the described embodiments, a trim procedure runs in a pre-selected directions of offset voltage ramp in order to average out the effect of hysteresis and metastability on the final trim offset choice. Different thresholds for accumulated slicer '0' and '1' discrimination of the circuitry to adjust trim offset allows for significant reduction in the number of trim runs, accelerating the slicers' trim process allowing for relatively quick determination of trim offset whenever the slicers are idle.


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