The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Aug. 08, 2013
Fujitsu Frontech Limited, Inagi-shi, Tokyo, JP;
Shinichi Eguchi, Inagi, JP;
FUJITSU FRONTECH LIMITED, Tokyo, JP;
Abstract
In a verification apparatus, a biometric information acquisition unit acquires a plurality of biometric information pieces from an object. A first verification unit calculates, as a verification score, the similarity between the biometric information piece and a verification information piece, and compares the calculated verification score with a first determination value to determine whether the biometric information piece matches the verification information piece. When the verification fails, a second verification unit performs verification on the plurality of biometric information pieces having a predetermined relationship, using the verification information piece and a second determination value which defines a less stringent criterion than the first determination value. The second verification unit compares the verification score with the second determination value, and determines that the match is confirmed when a plurality of biometric information pieces satisfy the criterion defined by the second determination value.