The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Dec. 18, 2014
Raytheon Company, Waltham, MA (US);
Tuan V. Nguyen, Anaheim, CA (US);
Oleg Brovko, Los Angeles, CA (US);
Alison Kim, Palos Verdes Estates, CA (US);
Jing Z. Stafsudd, Torrance, CA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
A method and apparatus for sampling a high bandwidth analog signal includes: splitting the high bandwidth analog signal into N parallel channels; randomly demodulating each of the signals; sampling each demodulated signal using a sub-Nyquist sampling rate; combining each sampled signal into a sub-Nyquist signal; compressive sensing the combined sub-Nyquist signal to estimate missing samples of a full Nyquist rate uniform sample set X(n); convolving X(n) with N analysis filters, each analysis filter having a different coefficient; decimating output of each analysis filter using decimation ratios of M:1 to generate a sub-banded signal set Y(n), i=1, . . . , N; processing the sub-banded signal set; up-sampling each processed sub-band signal by M; convolving each up-sampled sub-band signal with a corresponding synthesis filter; and combining two or more of the convolved signals to generate a non-uniform spectral partitioning of the high bandwidth analog signal.