The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Nov. 19, 2013
Applicant:

Renesas Mobile Corporation, Tokyo, JP;

Inventor:

Ryo Endo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/00 (2006.01); H04B 1/40 (2015.01); H03L 7/085 (2006.01); H03L 7/093 (2006.01); H03L 7/099 (2006.01); H03L 7/193 (2006.01);
U.S. Cl.
CPC ...
H04B 1/40 (2013.01); H03L 7/085 (2013.01); H03L 7/093 (2013.01); H03L 7/099 (2013.01); H03L 7/193 (2013.01); H03L 2207/50 (2013.01);
Abstract

A semiconductor device according to the present invention includes a PLL circuit, in which the PLL circuit includes: a phase difference detection unit that detects a phase difference between a reference signal and a division signal; a filter that outputs a control signal according to a detection result of the phase difference detection unit; an oscillation unit that outputs an oscillation signal of a frequency according to the control signal; a division unit that divides the oscillation signal to output it as the division signal; a noise intensity detection unit that detects a noise intensity of a predetermined frequency component included in the control signal; and a phase difference adjustment unit that adjusts a phase difference between the reference signal and the division signal based on the noise intensity detected by the noise intensity detection unit.


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