The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Jul. 02, 2014
Applicants:

Tsutoh Aoyama, Kanagawa, JP;

Masaru Shinkai, Kanagawa, JP;

Masahiro Ishimori, Tokyo, JP;

Keiji Ueda, Kanagawa, JP;

Kanshi Abe, Kanagawa, JP;

Manabu Nishimura, Hyogo, JP;

Toshiaki Masuda, Kanagawa, JP;

Inventors:

Tsutoh Aoyama, Kanagawa, JP;

Masaru Shinkai, Kanagawa, JP;

Masahiro Ishimori, Tokyo, JP;

Keiji Ueda, Kanagawa, JP;

Kanshi Abe, Kanagawa, JP;

Manabu Nishimura, Hyogo, JP;

Toshiaki Masuda, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01); H01L 41/31 (2013.01); B41J 2/14 (2006.01); H01L 41/09 (2006.01); H01L 41/316 (2013.01); H01L 41/318 (2013.01);
U.S. Cl.
CPC ...
H01L 41/31 (2013.01); B41J 2/14201 (2013.01); B41J 2/14233 (2013.01); H01L 41/0973 (2013.01); H01L 41/316 (2013.01); H01L 41/318 (2013.01); B41J 2202/03 (2013.01);
Abstract

An electromechanical transducer includes a first electrode mounted on one of a substrate and a base film, an electromechanical transducer film mounted on the first electrode and made of a piezoelectric substance having a perovskite crystal structure, and a second electrode mounted on the electromechanical transducer film. The electromechanical transducer film includes a {100} plane preferentially oriented to be orthogonal to a thickness direction of the electromechanical transducer film and has a full width at half maximum corresponding to a {200} plane in an X-ray diffraction measurement curve in 2θ-ω scan that is measured by emitting an X-ray beam onto a surface of the electromechanical transducer film at an incident angle θ. The full width at half maximum is not greater than 10 degrees.


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