The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Sep. 12, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mohammad Hasanuzzaman, Beacon, NY (US);

Jeffrey B. Johnson, Essex Junction, VT (US);

Kam-Leung Lee, Putnam Valley, NY (US);

Assignee:

GlobalFoundries Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 29/423 (2006.01); H01L 29/417 (2006.01); H01L 21/311 (2006.01); H01L 29/06 (2006.01); H01L 21/324 (2006.01); H01L 21/283 (2006.01); H01L 29/10 (2006.01); H01L 21/84 (2006.01);
U.S. Cl.
CPC ...
H01L 29/6681 (2013.01); H01L 21/283 (2013.01); H01L 21/31111 (2013.01); H01L 21/324 (2013.01); H01L 21/845 (2013.01); H01L 29/0692 (2013.01); H01L 29/1079 (2013.01); H01L 29/41791 (2013.01); H01L 29/4232 (2013.01); H01L 29/785 (2013.01); H01L 29/7833 (2013.01);
Abstract

A semiconductor device fabrication process includes forming a fin upon a semiconductor substrate and forming a gate upon the semiconductor substrate and upon and orthogonal to the fin, forming a source drain contacts by growing epitaxy material over the fin, forming a trench between the epitaxy material and a gate to expose an upper surface portion of the fin, doping the exposed fin portion to form an extension region, and activating the extension region. The semiconductor device may include the fin, gate, gate spacers upon sidewalls of the gate, a source drain contact adjacent to the gate spacers surrounding the fin, and doped extension regions within the fin below the gate spacers.


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