The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Nov. 21, 2012
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Yuichi Sawai, Tokyo, JP;

Takashi Naito, Tokyo, JP;

Takuya Aoyagi, Tokyo, JP;

Tadashi Fujieda, Tokyo, JP;

Mutsuhiro Mori, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01); H01L 23/373 (2006.01); B23K 35/26 (2006.01); H01L 23/00 (2006.01); C04B 37/02 (2006.01); C22C 13/00 (2006.01); H01L 21/52 (2006.01); H01L 33/62 (2010.01); H01L 33/64 (2010.01); C22C 5/06 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3736 (2013.01); B23K 35/26 (2013.01); C04B 37/025 (2013.01); C04B 37/026 (2013.01); C22C 5/06 (2013.01); C22C 13/00 (2013.01); H01L 21/52 (2013.01); H01L 23/3735 (2013.01); H01L 24/32 (2013.01); H01L 24/34 (2013.01); H01L 33/62 (2013.01); H01L 33/641 (2013.01); C04B 2235/96 (2013.01); C04B 2235/9607 (2013.01); C04B 2237/10 (2013.01); C04B 2237/12 (2013.01); C04B 2237/125 (2013.01); C04B 2237/366 (2013.01); C04B 2237/368 (2013.01); C04B 2237/408 (2013.01); H01L 23/3731 (2013.01); H01L 2224/32245 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/48228 (2013.01); H01L 2224/48464 (2013.01); H01L 2224/73221 (2013.01); H01L 2224/73265 (2013.01); H01L 2924/014 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/1432 (2013.01); H01L 2924/15747 (2013.01); H01L 2924/15787 (2013.01); Y10T 428/12014 (2015.01);
Abstract

Bondability and heat conductivity of a bonded body in which some of metal, ceramic, or semiconductor are bonded to each other are improved. In the bonded body in which a first member and a second member each comprise one of metal, ceramic, or semiconductor are bonded to each other, the second member is bonded to the first member by way of an adhesive member disposed to the surface of the first member, and the adhesive member contains a VO-containing glass and metal particles. In a semiconductor module having a base metal, a ceramic substrate, a metal wiring, and a semiconductor chip, the ceramic substrate is bonded to the base metal by way of a first adhesive member disposed to the surface of the base metal, the metal wiring is bonded to the ceramic substrate by way of a second adhesive member disposed to the surface of the ceramic substrate, the semiconductor chip is bonded to the metal wiring by way of a third adhesive member disposed to the surface of the metal wiring, and the first adhesive member, the second adhesive member, and the third adhesive member each comprise a VO-containing glass and metal particles.


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