The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Feb. 26, 2014
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Richard W. Ely, Lewisville, TX (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 7/40 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0042 (2013.01); G06K 9/4647 (2013.01); G06T 7/0083 (2013.01); G06T 7/0093 (2013.01); G06T 7/408 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/20144 (2013.01); G06T 2207/20148 (2013.01); G06T 2207/30252 (2013.01);
Abstract

A method for rejecting false alarms in preliminary detected ship candidates includes: receiving an image including the plurality of preliminary ship candidates; computing intensity and gradient statistics from an image background around each of the preliminary ship candidates; determining a set of thresholds from the computed intensity and gradient statistics; determining an outline and an orientation for each of the preliminary ship candidates, using the computed intensity and gradient statistics; extracting a plurality of features from each of the outlines and orientations of the preliminary ship candidates, wherein the plurality of features includes intensity-based features, gradient-based features, texture-based features and shape-based features; and rejecting false alarms in the plurality of preliminary detected ship candidates using the extracted features and the determined thresholds and statistical distance classifiers.


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