The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Sep. 19, 2013
Applicant:

Raytheon Canada Limited, Ottawa, CA;

Inventor:

Stanislaw Szapiel, Port Mcnicoll, CA;

Assignee:

RAYTHEON CANADA LIMITED, Ottawa, ON, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01); H04N 5/357 (2011.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G06T 5/20 (2013.01); H04N 5/3572 (2013.01);
Abstract

An imaging method and apparatus to provide digital calibration of an optical system that includes one or more removable plane parallel plates or optical wedges. One example of the method includes generating an initial estimate of an optical point spread function of an optical imaging system that includes a plane parallel plate or optical wedge positioned in the optical train based on an optical prescription of the optical imaging system, capturing a first image of a scene using the optical imaging system, and applying a blind deconvolution process to the first image using the initial estimate of the optical point spread function to produce a refined estimate of the optical point spread function and produce a second image that is substantially without blur.


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