The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Nov. 11, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Junichi Nakagawa, Tokyo, JP;
Mitsuhiro Ono, Tokyo, JP;
Hidetsugu Kagawa, Kawasaki, JP;
Nobutaka Miyake, Yokohama, JP;
Akitoshi Yamada, Yokohama, JP;
Fumitaka Goto, Tokyo, JP;
Ryosuke Iguchi, Kawasaki, JP;
Tomokazu Ishikawa, Yokohama, JP;
Senichi Saito, Funabashi, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
In order to print a unit area of a print medium by a first printing scan and a second printing scan, dither patterns are formed which can control the arrangement of dots on the print medium without adverse effects of density unevenness and graininess, that are caused by printing position displacement. Regarding first and second dither patterns, information indicating whether or not a threshold is already set to a reference pixel and one or more pixels around the reference pixel in the first dither pattern is obtained for cases where each pixel in the first dither pattern is the reference pixel. A pixel in the second dither pattern to which a predetermined pixel is to be set is determined based on the obtained information. The first and second dither patterns formed in the above manner are associated with the first printing scan and the second printing scan, respectively.